bit test
英 [bɪt test]
美 [bɪt test]
网络 位测试; 位检测指令; 位测试指令; 接收测试
双语例句
- You can even make tests a bit more granular and test a series of methods to ensure they meet a certain time threshold.
甚至可以测试得更加细致一些，可以测试一系列方法来确保它们满足特定的时间限制。 - It is actually used quite a bit just to test a Web service because of its simple interface, but its intention is to give you a starting point for a Web-based client using the client-side files.
实际上GSTC只对Web服务进行了一点点测试，因为它的接口很简单，但是它的目的是提供一个用客户端文件建立基于Web的客户程序的着手点。 - The execution model is a bit strange: The test class is reinstantiated every time a test method is executed.
执行模型有点奇怪：每次执行一个测试方法的时候，都要重新实例化测试类。 - Principle of software for precise data acquisition system and its application in single cone bit test
精密数据采集系统的软件原理及在单牙轮钻头实验中的应用 - Bit Error Rate Test, or Tester.
误码率测试或检验装置。 - Lastly, the design and implementation of Bit Error Rate Test are discussed.
论文最后对误码率测试模块的设计和实现进行了论述。 - The Research and Application of Don't Care Bit in Test Patterns Applied by Circuit-under-Test
无关位在被测电路自己施加测试矢量方法中的研究与应用 - This annex includes electronic material containing low bit rate LD_CELP implementation test vectors.
本附件包括含有低比特率LD-CELP实现测试矢量的电子资料。 - Application of the m Sequence In the Bit Error Test of the Trunked Radio Receiver analog-digital automatic program tester
m序列在数字集群接收机误码率测试中的应用模数自动程序测试程序 - Design of the BIT for the automatic test system of electronic equipments
电子设备自动测试系统的环绕BIT设计 - This error is a bit of a misnomer-the test just checks to see if anything was retrieved.
这个错误有点用词不当-测试只是检查看看有没有什么重新得到了什么东西。 - With the deep research and comprehensive application of BIT ( built-in test), exigent demands for the validation and estimate have been brought forward, and this field becomes a new focus on research.
随着机内测试（Built-inTest，BIT）的深入研究和广泛应用，对其验证和评价提出了迫切要求，也使这一领域成为新的研究热点。 - By analyzing PATRICIA, it is discovered that not keeping the order of NBTs ( next bit to test) in PATRICIA trie can improve the performance of PATRICIA insertion and decrease hardware design complexity.
研究发现，PATRICIA算法在用于定长匹配时如果不保持NBT值的有序性，可以有效地降低硬件设计复杂度，提高插入性能。 - After a short description of an intelligent BIT test adapter, the paper mainly discusses the principle of back driving, back driving technology in fault injection and the feature of back driving based fault injection.
文章首先简单介绍了智能化BIT测试适配器，接着重点阐述了后驱动技术的原理、后驱动故障注入的实现及后驱动故障注入的特点。 - According to the results of bearing diagnosis example, it is proved that this method possesses excellent optimization property, and can enhance the diagnostic correctness, decrease false alarm rate. The method has good prospects in the BIT ( built-in test) fault feature selection.
轴承诊断实例证明，该方法有较好的寻优特征子集的能力，能够提高BIT系统的诊断精度，降低系统的虚警率，因而在机电BIT故障特征选择中有较好的应用前景。 - Describes the concepts and the methodologies of fault injection. An applicable and convenient design idea is proposed for the intelligent BIT test adapter.
介绍了故障注入的概念和常用手段，提出一种实用、方便的智能化BIT测试适配器设计思想。 - Study on Intelligent BIT Test Adapter
智能化BIT测试适配器研究 - Design of IP Core for Bit Error Ratio Test
误码测试IP核的设计 - This paper introduces the software principle and the program compiling method for data acquisition with PDC ( precisidata acquisition and control system), and its application in the single cone bit test.
本文介绍了PDC数据采集（/控制站）的软件原理和编程方法及在单牙轮钻头实验中的应用。 - Study on intelligent BIT ( built-in test) technique of AC speed regulating system based on the BP neural network
基于BP网的交流电机调速系统智能机内检测技术研究 - The four key problems, i.e., the design of injection node, the realization of fault injection circuits, the design of the structure of the fault injection tool and the software package of the intelligent BIT test adapter, are mainly discussed.
对智能化测试适配器故障注入节点的设计、故障注入电路的实现、故障注入器结构体系的设计、智能化测试适配器软件包四个关键技术问题给出了具体的方案。 - In this paper, a new method for testability of Dimming and Focusing Autonomous System in Electro-optic Theodolite is introduced, that is BIT ( Build-in Test).
本文对光电经纬仪的小系统测试性采用了新的方法，即采用机内测试来完成。 - Then the methods of payload bit error test is discussed, and signal flow of payload bit error test system is given.
最后给出了净荷的误码测试方法以及误码测试系统的信号流程。 - Missile Control System BIT Test Methods Based on ANFIS
基于ANFIS的控制系统的BIT检测方法 - But BIT ( Built-in Test, in abbreviation machine tested) the technology to solve the above difficult problem in the aviation electron system application, and became enhances its test, the Maintainability effective way.
而BIT（Built-inTest，简称机内测试）技术在航空电子系统中的应用解决了上述难题，并成为提高其测试性、维修性有效途径。 - Paper researched the work theory and structure of traditional BERT, and use VHDL program language to realize a majority of BERT functions on FPGA, such as LCD driver, rs232 driver, error bit test, key and led control, etc.
研究了传统误码仪的工作原理与结构，并利用VHDL语言在FPGA芯片上模拟实现了绝大部分的传统误码仪的功能，如LCD显示驱动，串口通信驱动，误码测试，数据存储芯片驱动等功能。 - It is proved that BIT and ATE combined test technology can improve the testability of equipments effectively.
应用表明BIT和ATE组合测试技术可有效提高设备的测试性。 - In general average SoC chip has tens of billions of bit of test vectors.
一般来说平均每个SoC芯片上就拥有数百亿位的测试向量。